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X-Ray Fluorescence Analyser
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Brand: roentgenanalytik
型号： ComPact 5/PIN
规格： ComPact 5/PIN
Price: Negotiable
Min.Order: 1 SET
Supply 100 SET
Delivery: Shipment within 60 days since the date of payment
Address: China
Valid until: Never Expire
Updated on: 2023-06-02 10:31
Hits: 3074483
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Details
The ComPact 5/PIN offers a universal material and coating thickness analyser at a reasonable price/ performance ratio. The use of a high resolution Silicon Semiconductor detector makes the ComPact 5/PIN an ideal tool for users who want best limits of detection and highest precision together with maximum flexibility. Compared with a conventinal prop.- counter the Semiconductordetector offers about 4 times better energy resolution. This gives much better separation of overlapping elements. The much higher peak/ background ratio of the detector allows the analysis of very thin coatings, about 10 times thinner as so far possible. A very comprehensive library of software tools allows the analysis of bulk as well as liquid samples ( plating bath ). Multiple layer alloy coatings on complex base materials can be analysed as well.This makes the ComPact 5/PIN the ideal tool for the electronic industry.

Technical Data
HV Generator 25–50kV, max. 1,2mA current, software controlled
X-ray tube Microfocus, high performance Xray tube with thinned window, tungsten target with 0,1 x 0,1 mm spot
X-ray power 25-50kV, max. 50VA, application depending optimised
[Option] Micro focus tube, spot 85µm x 85µm, Be-window (in conjunction with filter changer)
Single collimator 0.3 or 0,6 mm Ø
Collimator changer Four positions, programmable and motorised
[Option] 0.2mm, 0.4 mm, 0.6mm, 0,8 mm Ø

customs specified
Sample Stage Programmable and motorized X - 100 mm, Y - 85mm, Z- 60mm, Easy Load
Sample positioning Joy Stick, Point & Shoot, Laser, Auto focus
Video system Colour video system, field of view 4 x 3mm
Magnification Approx. 40 x
Detectorsystem Peltier cooled Silicon semiconductor detector ( PIN- diode ), 25 mm2 active area,

0,5 mm thick, Be- entrancewindow 25 µm thick, energy resolution ca. 300 eV ( FWHM at 5,9 keV )
Radiation safety PTB tested, totally fail safe system
Chamber H - 45cm, B - 40cm, D - 65cm, slotted sample chamber
Sample Chamber Useable H - 6cm, W - 35cm, D - 38cm
Mains supply 110V/230V 60Hz/50Hz


X-MasteR Software Operating software with WINDOWS 2000 / NT using modern PC Technology
µ-MasteR evaluation module for coating thickness measurement
Fun-MasteR Calibration module using fundamental parameter mathematics
Element-MasteR Qualitative material identification for up to 20 elements
%-MasteR Quantitative material analysis for up to 8 elements
Liquid-MasteR Plating bath analysis
Data-MasteR Data base and statistic software for long term process control and documentation
Report-MasteR Software module for customised reports.

(Technical specification can change without further notice)
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